Testing Capabilities

Below is a list, including brief descriptions, of the testing capabilities of Asia-Link's Quality Assurance department.

Chatillon TCD200 Test Stand with DFGS-R-ND Reader:
This equipment is used to test insertion/withdrawal force, wire tensile strength, and contact crimp strength.

CMI model XRX Series Plating Thickness Measurement System:
This equipment is used to measure the plating thickness of various contacts. Thickness is measured in micro-inches.

Hewlett-Packard Model 8753 S Parameter Network Analyzer:
This network analyzer is used to measure various electrical parameters, including impedance of 50 Ohm assemblies within a range of 30 kHz - 6 GHz.

Hewlett-Packard Model 8714ET RF Network Analyzer:
This network analyzer is used to measure various electrical parameters, including impedance of 75 Ohm assemblies within a range of 300 kHz - 3 GHz.

Cirris Signature Touch 1:
Cable/Harness test equipment with HiPot functionality that tests for opens, shorts, miswires, etc.Utilizes a graphic touch screen for easy use.

Cirris Signature 1000R+:
Cable/Harness test equipment that tests for opens, shorts, miswires, etc.

IL 1400A Radiometer/Photometer:
Tests brightness of LEDs on printed circuit boards and wire harnesses.

Stanford Research Systems Model SR720 LCR Meter:
Measures resistance, capacitance, and impedance of components.

Microscope with Video Output:
Used to visually inspect printed circuit boards per IPC-A-610C and cable assemblies.

Additional Minor Equipment:

Fluke 8012A
Tektronix PS280
Fluke 10
Fluke 11
Cirris Signature 1000R+
Cirris Signature 1000R+ Add-on
Fluke 73 Series II Multimeter
Normark Weigh Scale (1-10 lbs.)
Normark Weigh Scale (1-50 lbs.)
Lectronix LM-1

Testing Capabilities

Below is a list, including brief descriptions, of the testing capabilities of Asia-Link's Quality Assurance department.

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